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HSEM-06PS Room Temperature Variable Field Probe Bench Hall Test System can be placed 4 inch wafer samples, using porous zoning control gas adsorption fixation, can provide a variable magnetic field environment, magnetic field size ± 0.6T , can be installed 6 probe arm. External connection to other electrical instrumentation can be at room temperature on the chip, wafer and device for non-destructive electrical testing, such as current, voltage, resistance and other electrical signals under different magnetic fields.

HSEM series electromagnet Hall effect test system consists of electromagnet, Hall tester, controller, sample variable temperature options and other components. There are continuously variable magnetic field environment, can choose ± 0.8T or ± 1.5T two configurations, there are more abundant temperature options, including: room temperature, liquid nitrogen single-point, 10K-400K closed-cycle low-temperature options, room temperature-1273K high-temperature options.